Below is a list of Microscopy and Microanalytical Techniques available from Materials Characterization Services. Click on any hyperlinked technique to learn more about it.
Microscopy and Microanalytical Techniques |
EELS - Electron Energy Loss Spectroscopy |
EDS - Energy Dispersive Spectrometry |
EDX - Energy Dispersive X-ray |
FIB - Focused Ion Beam |
LA-ICPMS - Laser Ablation Inductively Coupled Plasma Mass Spec. |
MFM - Magnetic Force Microscopy |
OM - Optical Microscopy |
OP - Optical Profilometry |
Particle Size Analysis |
DLS - Dynamic Light Scattering |
LLS - Laser Light Scattering |
Radiography |
SAM - Scanning Acoustic Microscopy |
SEM - Scanning Electron Microscopy |
STEM - Scanning Transmission Electron Microscopy |
TEM - Transmission Electron Microscopy |
CT - Computed Tomography X-ray Imaging |
XRT - X-ray Topography |