---
title: "Surface and Thin Film Techniques"
url: "https://mat-cs.com/analytical-techniques/surface-thin-film-techniques/"
description: "Click through for a list of Surface and Thin Film Techniques available from Materials Characterization Services."
---

Analytical Techniques

# Surface and Thin Film Techniques

Click through for a list of Surface and Thin Film Techniques available from Materials Characterization Services.

[Back to Analytical Techniques](/analytical-techniques/)

**Below is a list of Surface and Thin Film Techniques available from Materials Characterization Services**. **Click on any hyperlinked technique to learn more about it.**

Search for Analytical Techniques and Test MethodsWhen autocomplete results are available use up and down arrows to review and enter to go to the desired page. Touch device users, explore by touch or with swipe gestures.

*   [3-D Surface Profiling](/3-d-surface-profiling/)
*   [3-Omega Thermal Conductivity](/3-omega-thermal-conductivity/)
*   [Adhesion](/adhesion-analysis/)
*   [AFM - Atomic Force Microscopy](/afm-atomic-force-microscopy/)
*   [AES - Auger Electron Spectroscopy](/aes-auger-electron-spectrocsopy/)
*   [Contact Angle Measurement](/contact-angle-measurement/)
*   [EBSD - Electron BackScatter Diffraction](/ebsd-electomic-force-microscopy/)
*   [EDS - Energy Dispersive Spectrometry](/eds-energy-dispersive-spectrometry/)
*   [ESCA - Electron Spectroscopy for Chemical Analysis](/esca-electron-spectroscopy-for-chemical-analysis/)
*   [Ellipsometry](/ellipsometry/)
*   [EXAFS - Extended X-ray Absorption Fine Structure](/exafs-extended-x-ray-absorption-fine-structure/)
*   [Hardness Testing](/hardness-testing/)
*   [HFS - Hydrogen Forward Scattering](/hydrogen-forward-scattering-spectrometry-hfs/)
*   [ISS - Ion Scattering Spectroscopy](/iss-ion-scattering-spectroscopy/)
*   [LA-ICPMS - Laser Ablation Inductively Coupled Plasma Mass Spectrometry](/la-icpms-laser-ablation-inductively-coupled-plasma-mass-spectrometry/)
*   [MicroHardness](/microhardness-analysis/)
*   [Nanoindentation](/nanoindentation/)
*   [NRA - Nuclear Reaction Analysis](/nra-nuclear-reaction-analysis/)
*   [PIXE - Particle Induced X-Ray Emission](/pixe-particle-induced-x-ray-emission/)
*   [PALS - Positron Annihilation Lifetime Spectroscopy](/pals-positron-annihilation-lifetime-spectroscopy/)
*   [Profilometry (Contact and Non-Contact)](/profilometry-contact-and-non-contact/)
*   [RBS - Rutherford Backscattering Spectrometry](/rbs-rutherford-backscattering-spectrometry/)
*   [SPM - Scanning Probe Microscopy](/spm-scanning-probe-microscopy/)
*   [SIMS - Secondary Ion Mass Spectrometry](/sims-secondary-ion-mass-spectrometry/)
*   [Surface Roughness/Flatness](/surface-roughness-flatness/)
*   [TDS - Thermal Desorption Spectrometry](/tds-thermal-desorption-spectrometry/)
*   [TDTR - Time Domain ThermoReflectance](/tdtr-time-domain-thermoreflectance/)
*   [TOF-SIMS – Time-of-Flight Secondary Ion Mass Spectrometry](/tof-sims-time-of-flight-secondary-ion-mass-spectrometry/)
*   [TXRF - Total Reflection X-ray Fluorescence](/txrf-total-reflection-x-ray-fluorescence/)
*   [Tribology](/tribology/)
*   [UPS- Ultraviolet Photoelectron Spectroscopy](/txrf-total-reflection-x-ray-fluorescence/)
*   [VPD-ICPMS - Vapor Phase Decomposition/ICPMS](/vpd-icpms-vapor-phase-decomposition-icpms/)
*   [Wafer Bow and Warp](/wafer-bow-and-warp/)
*   [Wear & Friction](/wear-friction/)
*   [XRD - X-ray Diffraction](/xrd-x-ray-diffraction/)
*   [XRF - X-ray Fluorescence](/xrf-x-ray-fluorescence/)
*   [XPS – X-ray Photoelectron Spectroscopy](/xps-x-ray-photoelectron-spectroscopy/)
*   [XRR - X-ray Reflectivity](/xxr-x-ray-reflectivity/)