Below is a list of Electrical & Electronics Test Methods available from Materials Characterization Services. Click on any hyperlinked technique to learn more about it.
Electrical Test Methods & Electronics |
4 Point Probe |
ATE - Automated Test Equipment |
Automated Test Equipment |
C-V - Capacitance-Voltage |
Conductivity |
Construction Analysis |
Decapsulation |
DLTS - Deep Level Transient Spectroscopy |
Dielectric Constant |
ECV - Electrochemical Capacitance Voltage |
ESD - ElectroStatic Discharge |
EMMI - Emission Microscopy |
FIB - Focused Ion Beam |
Hall Mobility |
HAST - Highly Accelerated Temperature and Humidity Stress Test |
Latchup |
Lifetime Measurement |
µPCD - Microwave PhotoConductive Decay |
PCB Failure Analysis |
Reliability |
Resistivity |
SIRM - Scanning Infrared Microscopy |
Sheet resistance (4 Point Probe) |
SRP - Spreading Resistance Profiling |
SPV - Surface Photo Voltage |
Wire Bond Strength |