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MAT-CS - Materials Characterization Services

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Microscopy and Microanalytical Techniques

Below is a list of Microscopy and Microanalytical Techniques available from Materials Characterization Services. Click on any hyperlinked technique to learn more about it.

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Microscopy and Microanalytical Techniques

AFM - Atomic Force Microscopy

CT - Computed Tomography X-ray Imaging

DLS - Dynamic Light Scattering

EELS - Electron Energy Loss Spectroscopy

EDS - Energy Dispersive Spectrometry

EDX - Energy Dispersive X-ray

FIB - Focused Ion Beam

LA-ICPMS - Laser Ablation Inductively Coupled Plasma Mass Spectrometry

 LLS - Laser Light Scattering

MFM - Magnetic Force Microscopy

OM - Optical Microscopy

Particle Size Analysis (PSD)

Profilometry

Radiography

SAM - Scanning Acoustic Microscopy

SEM - Scanning Electron Microscopy

SPM - Scanning Probe Microscopy

STEM - Scanning Transmission Electron Microscopy

TEM - Transmission Electron Microscopy

XRT - X-ray Topography

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