Below is a list of Microscopy and Microanalytical Techniques available from Materials Characterization Services. Click on any hyperlinked technique to learn more about it. Search for Analytical Techniques and Test Methods When autocomplete results are available use up and down arrows to review and enter to go to the desired page. Touch device users, explore by touch or with swipe gestures. Microscopy and Microanalytical TechniquesAFM - Atomic Force MicroscopyCT - Computed Tomography X-ray ImagingDLS - Dynamic Light ScatteringEELS - Electron Energy Loss SpectroscopyEDS - Energy Dispersive SpectrometryEDX - Energy Dispersive X-rayFIB - Focused Ion BeamLA-ICPMS - Laser Ablation Inductively Coupled Plasma Mass Spectrometry LLS - Laser Light ScatteringMFM - Magnetic Force MicroscopyOM - Optical MicroscopyParticle Size Analysis (PSD)ProfilometryRadiographySAM - Scanning Acoustic MicroscopySEM - Scanning Electron MicroscopySPM - Scanning Probe MicroscopySTEM - Scanning Transmission Electron MicroscopyTEM - Transmission Electron MicroscopyXRT - X-ray Topography