• Skip to main content
  • Skip to header right navigation
  • Skip to site footer

1-800-685-2088 | support@mat-cs.com

  • LinkedIn
MAT-CS - Materials Characterization Services

Materials Characterization Services

  • Home
  • About
    • Meet the Team
    • Consulting
  • Analytical Techniques
    • Bulk Analysis
    • Microscopy and Microanalytical
    • Surface and Thin Film
    • Polymer Characterization
    • Optical Measurements
    • Liquids and Gases
    • Electrical / Electronics
    • Reliability Testing
    • Miscellaneous
  • Test Methods
    • ASTM Methods List
    • ISO Methods List
    • AATCC
    • AOAC
    • AOCS
    • EPA, SM
    • FDA BAM
    • IP
    • JEDEC
    • MIL-STD
    • OCSPP
    • OPPTS
    • REACH
    • RoHS
    • SEMI
    • TAPPI
    • USP/EP/JP
  • Resources
    • Experiment Design
    • Consulting
    • The Laboratory Landscape
    • Quality Programs
    • Regulatory-Based Analyses
  • Contact
  • Get a Quote!
MAT-CS Home Cover

Surface and Thin Film Techniques

Below is a list of Surface and Thin Film Techniques available from Materials Characterization Services. Click on any hyperlinked technique to learn more about it.

When autocomplete results are available use up and down arrows to review and enter to go to the desired page. Touch device users, explore by touch or with swipe gestures.

Surface and Thin Film Techniques

3-D Surface Profiling

3-Omega Thermal Conductivity

Adhesion

AFM - Atomic Force Microscopy

AES - Auger Electron Spectroscopy

Contact Angle Measurement

EBSD - Electron BackScatter Diffraction

EDS - Energy Dispersive Spectrometry

ESCA - Electron Spectroscopy for Chemical Analysis

Ellipsometry

EXAFS - Extended X-ray Absorption Fine Structure

Hardness Testing

HFS - Hydrogen Forward Scattering

 ISS - Ion Scattering Spectroscopy

LA-ICPMS - Laser Ablation Inductively Coupled Plasma Mass Spectrometry

MicroHardness

Nanoindentation

NRA - Nuclear Reaction Analysis

PIXE - Particle Induced X-Ray Emission

PALS - Positron Annihilation Lifetime Spectroscopy

Profilometry (Contact and Non-Contact)

RBS - Rutherford Backscattering Spectrometry

SPM - Scanning Probe Microscopy

SIMS - Secondary Ion Mass Spectrometry

Surface Roughness/Flatness

TDS - Thermal Desorption Spectrometry

TDTR - Time Domain ThermoReflectance

TOF-SIMS – Time-of-Flight Secondary Ion Mass Spectrometry

TXRF - Total Reflection X-ray Fluorescence

Tribology

UPS- Ultraviolet Photoelectron Spectroscopy

VPD-ICPMS - Vapor Phase Decomposition/ICPMS

Wafer Bow and Warp

Wear & Friction

XRD - X-ray Diffraction

XRF - X-ray Fluorescence

XPS – X-ray Photoelectron Spectroscopy

XRR - X-ray Reflectivity

Ready to start your analysis?

Get a Quote!
MAT-CS

Your One Source for Materials Analysis

1-800-685-2088

support@mat-cs.com

  • Home
  • Analytical Techniques
  • Test Methods
  • Resources
  • Contact Us
  • Get a Quote!
  • Special Analysis Request

  • LinkedIn

Copyright © 2025 by Materials Characterization Services ยท All Rights Reserved
Website Built, Hosted, and Managed by Digital Donkey Marketing