XRR – X-ray Reflectivity
Description: X-ray Reflectivity (XRR), also known as X-ray reflectometry, is a non-destructive analytical technique used to study the surface and interface structures of thin films, multilayers, and layered materials. It is particularly useful for characterizing the thickness, density, roughness, and interfacial properties of these materials. XRR involves the reflection of X-rays off a sample at …