Materials Characterization Services
Search for Analytical Techniques and Test Methods
We are currently working on updating our list of supported methods. If you don’t see the test method you need below, please submit a special request with details about the method you need and we will check to see if we can provide it.
Scanning Acoustic Microscopy (SAM) is an imaging technique used to visualize and analyze internal structures and material properties by employing high-frequency ultrasound waves. Principles: Applications: Strengths: Limitations: In summary, Scanning Acoustic Microscopy (SAM) is a valuable imaging technique for non-destructive evaluation and characterization of internal structures and material properties. Its strengths lie in high-resolution imaging, …
Industrial Radiography is a non-destructive testing (NDT) technique used for examining the internal structure, integrity, and flaws within various materials by using ionizing radiation to create images of the object’s internal features. It’s commonly used in industries such as aerospace, construction, manufacturing, and oil and gas. Principles: Applications: Strengths: Limitations: In summary, Industrial Radiography is …
Particle Size Analysis (PSD – Particle Size Distribution) is a crucial technique used to determine the size distribution of particles in a given sample. Accurate particle size analysis provides insights into various properties of materials, impacting industries ranging from pharmaceuticals and cosmetics to mining and environmental sciences. Principles: Applications: Strengths: Limitations: In summary, Particle Size …
Optical Microscopy (OM) is a widely used imaging technique that employs visible light and lenses to magnify and visualize specimens, offering a view of the sample’s structure and details at a microscopic level. Principles: Applications: Strengths: Limitations: In summary, Optical Microscopy (OM) is a versatile and widely accessible imaging technique used for examining structures and …
Magnetic Force Microscopy (MFM) is an imaging technique used to visualize and map magnetic fields at the nanoscale by detecting the magnetic forces between a magnetic probe and a sample. It provides spatial information about the magnetic properties of materials with high resolution. Principles: Applications: Strengths: Limitations: In summary, Magnetic Force Microscopy (MFM) is a …
Description: Scanning Electron Microscopy (SEM) is a powerful imaging technique used to visualize the surface morphology, structure, and composition of samples at high magnification and resolution by utilizing a focused beam of electrons. Principles: Applications: Strengths: Limitations: In summary, Scanning Electron Microscopy (SEM) is a versatile and powerful tool for imaging and analyzing the surface …
Description: Laser Light Scattering (LLS), also known as Laser Diffraction, is a technique used to analyze particles in a suspension or solution by measuring the scattering pattern of a laser beam interacting with these particles. It provides valuable information about particle size distribution in a sample. Principles: Applications: Strengths: Limitations: In summary, Laser Light Scattering …
Description: Focused Ion Beam (FIB) is an advanced technique primarily used in microscopy and nanofabrication, employing a focused beam of ions for imaging, milling, and manipulating materials at a micro- and nanometer scale. Principles: Applications: Strengths: Limitations: In summary, Focused Ion Beam (FIB) technology is a powerful tool for imaging, material modification, fabrication, and 3D …
Description: Laser Light Scattering (LLS), also known as Laser Diffraction, is a technique used to analyze particles in a suspension or solution by measuring the scattering pattern of a laser beam interacting with these particles. It provides valuable information about particle size distribution in a sample. Principles: Applications: Strengths: Limitations: In summary, Laser Light Scattering …
Description: Focused Ion Beam (FIB) is an advanced technique primarily used in microscopy and nanofabrication, employing a focused beam of ions for imaging, milling, and manipulating materials at a micro- and nanometer scale. Principles: Applications: Strengths: Limitations: In summary, Focused Ion Beam (FIB) technology is a powerful tool for imaging, material modification, fabrication, and 3D …
