Materials Characterization Services
Search for Analytical Techniques and Test Methods
We are currently working on updating our list of supported methods. If you don’t see the test method you need below, please submit a special request with details about the method you need and we will check to see if we can provide it.
Description: Ion Scattering Spectroscopy (ISS) is a surface-sensitive analytical technique used to study the composition and structure of the outermost atomic layers of a solid material. ISS is primarily employed for the analysis of surfaces, thin films, and interfaces. It provides information about the elemental composition and chemical bonding of the top few atomic layers …
Description: Extended X-ray Absorption Fine Structure (EXAFS) is a powerful experimental technique in the field of X-ray spectroscopy, primarily used to investigate the local atomic structure of materials. It provides valuable insights into the arrangement of atoms in the vicinity of a particular element in a sample. EXAFS is particularly useful for characterizing the local …
Description: Contact angle measurement is a technique used to determine the angle at which a liquid droplet or meniscus makes contact with a solid surface. This angle is called the “contact angle” and is a critical parameter in understanding the wetting behavior of a liquid on a particular solid substrate. Contact angle measurement plays a …
Description: Ellipsometry is a non-destructive optical technique used to measure and analyze the properties of thin films and surfaces. It is based on the principles of polarized light and the interaction of light with materials, particularly thin films. Ellipsometry is widely used in various scientific and industrial applications for characterizing and quantifying a range of …
Description: Electron Spectroscopy for Chemical Analysis (ESCA), also known as X-ray Photoelectron Spectroscopy (XPS), is a surface-sensitive analytical technique used to investigate the chemical composition and electronic structure of materials. It is based on the interaction between X-rays and electrons in a sample’s surface, providing valuable information about the elemental composition, chemical bonding, and electronic …
Description: Electron Backscatter Diffraction (EBSD) is a powerful materials characterization technique used to analyze the crystallographic structure of a sample at the micrometer to nanometer scale. EBSD relies on the interaction of electrons with the atomic lattice of a material to obtain information about its crystallography. Here, I’ll describe EBSD, its applications, strengths, and limitations: …
Description: Atomic Force Microscopy (AFM) is a versatile and powerful tool for imaging and characterizing the topography, mechanical properties, and surface interactions of a wide range of materials at the nanoscale. It was developed in the 1980s and has since become an essential instrument in various scientific disciplines, including materials science, biology, physics, and chemistry. …
Description: Auger Electron Spectroscopy (AES) is a surface-sensitive analytical technique used to determine the elemental composition and chemical state of the top few atomic layers of a solid material. It operates based on the Auger effect, which is the emission of Auger electrons when an atom in an excited state relaxes to a lower energy …
ASTM D2240 – Standard Test Method for Rubber Property—Durometer Hardness Description: Scope 1.1 This test method covers twelve types of rubber hardness measurement devices known as durometers: Types A, B, C, D, DO, E, M, O, OO, OOO, OOO-S, and R. The procedure for determining indentation hardness of substances classified as thermoplastic elastomers, vulcanized (thermoset) rubber, …
ASTM D1653 – Standard Test Methods for Water Vapor Transmission of Organic Coating Films Description: Scope 1.1 These test methods cover the determination of the rate at which water vapor passes through films of paint, varnish, lacquer, and other organic coatings. The films may be free films or they may be applied to porous substrates. 1.2 A …
