• Skip to main content
  • Skip to header right navigation
  • Skip to site footer

1-800-685-2088 | support@mat-cs.com

  • LinkedIn
MAT-CS - Materials Characterization Services

Materials Characterization Services

  • Home
  • About
    • Meet the Team
    • Consulting
  • Analytical Techniques
    • Bulk Analysis
    • Microscopy and Microanalytical
    • Surface and Thin Film
    • Polymer Characterization
    • Optical Measurements
    • Liquids and Gases
    • Electrical / Electronics
    • Reliability Testing
    • Miscellaneous
  • Test Methods
    • ASTM Methods List
    • ISO Methods List
    • AATCC
    • AOAC
    • AOCS
    • EPA, SM
    • FDA BAM
    • IP
    • JEDEC
    • MIL-STD
    • OCSPP
    • OPPTS
    • REACH
    • RoHS
    • SEMI
    • TAPPI
    • USP/EP/JP
  • Resources
    • Experiment Design
    • Consulting
    • The Laboratory Landscape
    • Quality Programs
    • Regulatory-Based Analyses
  • Contact
  • Get a Quote!
MAT-CS Home Cover

PALS – Positron Annihilation Lifetime Spectroscopy

Description:

Positron Annihilation Lifetime Spectroscopy (PALS) is a non-destructive analytical technique used to study the behavior of positrons in matter. Positrons are the antimatter counterparts of electrons, and when they encounter electrons in a material, they can annihilate each other, releasing gamma-ray photons. PALS measures the time delay between the creation of positron-electron pairs and their subsequent annihilation, which provides valuable information about the electronic structure and defects in the material being studied.

Applications of PALS:

  1. Material Characterization: PALS is commonly used to investigate the electronic structure, defects, and free volume in a wide range of materials, including polymers, metals, semiconductors, ceramics, and organic materials.
  2. Semiconductor and Polymer Research: PALS can be employed to study defects in semiconductors and polymer materials, helping to understand their electrical properties and performance.
  3. Nanomaterials and Porous Materials: PALS is useful for characterizing nanoporous materials, such as zeolites and metal-organic frameworks, by providing information on pore sizes and connectivity.
  4. Radiation Damage Studies: PALS can be used to analyze the effects of radiation on materials, such as those used in nuclear reactors or space applications.
  5. Positronium Research: PALS can provide insights into the formation and lifetime of positronium, a bound state of an electron and a positron, in various materials.

Strengths of PALS:

  1. Non-Destructive: PALS is a non-destructive technique, allowing researchers to study materials without altering their properties.
  2. Sensitive to Defects: PALS is highly sensitive to the presence of defects, such as vacancies and dislocations, making it a valuable tool for defect characterization.
  3. Depth Profiling: PALS can provide information about defects and free volume at different depths within a material, allowing for depth profiling.
  4. High Resolution: PALS can offer high temporal resolution, making it suitable for studying fast processes in materials.
  5. Complementary Technique: PALS can be used in conjunction with other analytical techniques, such as positron annihilation Doppler broadening spectroscopy (PADB), to obtain a more comprehensive picture of a material’s properties.

Limitations of PALS:

  1. Limited Spatial Resolution: PALS provides information on a nanometer scale but is limited by its spatial resolution. It cannot provide atomic-scale information.
  2. Sample Size: PALS typically requires a minimum sample size, which may limit its applicability to very small or thin materials.
  3. Complex Data Analysis: Interpreting PALS data can be challenging, as it involves complex mathematical modeling and fitting procedures.
  4. Limited Elemental Sensitivity: PALS primarily provides information about the electronic structure of a material, and it may not be as sensitive to specific chemical elements as some other techniques.
  5. Limited Availability: PALS equipment can be relatively specialized and expensive, which limits its availability in some research settings.

In summary, PALS is a valuable analytical technique for studying the electronic structure and defects in various materials, making it particularly useful in material science and solid-state physics. Its strengths include non-destructiveness, sensitivity to defects, and depth profiling capabilities, but it has limitations regarding spatial resolution, sample size requirements, and data analysis complexity.

Related Test Methods

EPR – Electron Paramagnetic Resonance

Goniometric Testing

UV-VIS

Scatterometry

xyy Color

Lab* Color

Reflectance

Transmission

Absorption

Emissivity

Deformulation

Rheology

Previous Post:MAT-CS Home CoverNanoindentation
Next Post:RBS – Rutherford Backscattering SpectrometryMAT-CS Home Cover

Ready to start your analysis?

Get a Quote!
MAT-CS

Your One Source for Materials Analysis

1-800-685-2088

support@mat-cs.com

  • Home
  • Analytical Techniques
  • Test Methods
  • Resources
  • Contact Us
  • Get a Quote!
  • Special Analysis Request

  • LinkedIn

Copyright © 2025 by Materials Characterization Services · All Rights Reserved
Website Built, Hosted, and Managed by Digital Donkey Marketing