Materials Characterization Services
Search for Analytical Techniques and Test Methods
We are currently working on updating our list of supported methods. If you don’t see the test method you need below, please submit a special request with details about the method you need and we will check to see if we can provide it.
Description: X-ray Fluorescence (XRF) is an analytical technique used for the qualitative and quantitative determination of the elemental composition of various materials. It works by measuring the characteristic X-rays emitted when a sample is irradiated with high-energy X-rays or gamma rays. These emitted X-rays are associated with the inner electron transitions of atoms in the …
Description: X-ray Diffraction (XRD) is a powerful analytical technique used to investigate the structure of crystalline materials by analyzing the way X-rays are scattered by the crystal lattice. XRD is based on the principle of Bragg’s law, which states that X-rays incident on a crystal at a specific angle will undergo constructive interference and produce …
Description: VPD-ICP-MS stands for Vapor Phase Decomposition-Inductively Coupled Plasma Mass Spectrometry. It is an analytical technique used in the field of analytical chemistry and is primarily employed for the analysis of solid samples, especially those containing metals or other elements of interest. VPD-ICP-MS combines two key components: Vapor Phase Decomposition (VPD) and Inductively Coupled Plasma …
Description: Total Reflection X-Ray Fluorescence (TXRF) is an analytical technique used for elemental analysis. It is a specialized form of X-ray fluorescence (XRF) spectroscopy that is particularly useful for analyzing trace elements on a solid surface. Here is a description of TXRF, its applications, strengths, and limitations: In summary, Total Reflection X-Ray Fluorescence is a …
Description: Secondary Ion Mass Spectrometry (SIMS) is an analytical technique used for the elemental and isotopic analysis of solid materials. It provides detailed information about the composition and distribution of elements and isotopes on the surface of a sample. SIMS works by bombarding the surface of a sample with a primary ion beam, which causes …
Description: Rutherford Backscattering Spectrometry (RBS) is an ion scattering technique that is used primarily for compositional thin film analysis. RBS is unique in that it allows quantification without the use of reference standards and is frequently used to calibrate other analytical methods. It is typically the method of choice for quantitative compositional analysis of thin …
Description: Positron Annihilation Lifetime Spectroscopy (PALS) is a non-destructive analytical technique used to study the behavior of positrons in matter. Positrons are the antimatter counterparts of electrons, and when they encounter electrons in a material, they can annihilate each other, releasing gamma-ray photons. PALS measures the time delay between the creation of positron-electron pairs and …
Description: Nanoindentation analysis is a versatile and powerful technique used to measure mechanical properties of materials at the nanoscale. It involves using a sharp indenter, often made of diamond or another hard material, to apply a controlled force or load to the surface of a material while continuously monitoring the depth of penetration. This process …
Description: Microhardness analysis is a materials testing technique used to measure the hardness of small-scale features or microstructures within a material. It is a valuable tool in materials science and engineering for characterizing the mechanical properties of materials on a small scale. Here’s a description of microhardness analysis, its applications, strengths, and limitations: 1. Description: …
Description: Hydrogen Forward Scattering Spectrometry (HFS) is an ion scattering technique that is used to quantitatively determine the vertical distribution of hydrogen in thin films. During the process, He2+ ions hit the sample surface at a glancing angle, knocking hydrogen atoms out of the sample, which can then be analyzed using a solid state detector. The …
