Materials Characterization Services
Search for Analytical Techniques and Test Methods
We are currently working on updating our list of supported methods. If you don’t see the test method you need below, please submit a special request with details about the method you need and we will check to see if we can provide it.
Magnetic Force Microscopy (MFM) is an imaging technique used to visualize and map magnetic fields at the nanoscale by detecting the magnetic forces between a magnetic probe and a sample. It provides spatial information about the magnetic properties of materials with high resolution. Principles: Applications: Strengths: Limitations: In summary, Magnetic Force Microscopy (MFM) is a …
Description: Scanning Electron Microscopy (SEM) is a powerful imaging technique used to visualize the surface morphology, structure, and composition of samples at high magnification and resolution by utilizing a focused beam of electrons. Principles: Applications: Strengths: Limitations: In summary, Scanning Electron Microscopy (SEM) is a versatile and powerful tool for imaging and analyzing the surface …
Description: Laser Light Scattering (LLS), also known as Laser Diffraction, is a technique used to analyze particles in a suspension or solution by measuring the scattering pattern of a laser beam interacting with these particles. It provides valuable information about particle size distribution in a sample. Principles: Applications: Strengths: Limitations: In summary, Laser Light Scattering …
Description: Focused Ion Beam (FIB) is an advanced technique primarily used in microscopy and nanofabrication, employing a focused beam of ions for imaging, milling, and manipulating materials at a micro- and nanometer scale. Principles: Applications: Strengths: Limitations: In summary, Focused Ion Beam (FIB) technology is a powerful tool for imaging, material modification, fabrication, and 3D …
Description: Laser Light Scattering (LLS), also known as Laser Diffraction, is a technique used to analyze particles in a suspension or solution by measuring the scattering pattern of a laser beam interacting with these particles. It provides valuable information about particle size distribution in a sample. Principles: Applications: Strengths: Limitations: In summary, Laser Light Scattering …
Description: Focused Ion Beam (FIB) is an advanced technique primarily used in microscopy and nanofabrication, employing a focused beam of ions for imaging, milling, and manipulating materials at a micro- and nanometer scale. Principles: Applications: Strengths: Limitations: In summary, Focused Ion Beam (FIB) technology is a powerful tool for imaging, material modification, fabrication, and 3D …
Description: Dynamic Light Scattering (DLS), also known as Photon Correlation Spectroscopy, is a technique used to determine the size distribution of particles in suspension or macromolecules in solution by analyzing the fluctuations in scattered light caused by Brownian motion. Principles: Applications: Strengths: Limitations: In summary, Dynamic Light Scattering (DLS) is a valuable technique for analyzing …
Description: Electron Energy Loss Spectroscopy (EELS) is an analytical technique used in transmission electron microscopy (TEM) to investigate the elemental composition, chemical bonding, and electronic structure of materials at a nanometer scale. Principles: Applications: Strengths: Limitations: In summary, Electron Energy Loss Spectroscopy (EELS) is a powerful technique for studying the electronic structure and elemental composition …
Description: Computed Tomography (CT) X-ray Imaging is a non-destructive imaging technique used to create detailed cross-sectional images or 3D reconstructions of objects or samples. It utilizes X-rays to generate images by rotating the object and capturing X-ray projections from various angles. Principles: Applications: Strengths: Limitations: In summary, Industrial Computed Tomography (CT) X-ray Imaging is a …
Description: Energy Dispersive X-ray Spectroscopy (EDS or EDX) is an analytical technique used to qualitatively and quantitatively determine the elemental composition of a sample by analyzing the characteristic X-rays emitted when the sample is bombarded with an electron beam, often in conjunction with scanning electron microscopy (SEM). Principles: Applications: Strengths: Limitations: In summary, Energy Dispersive …
