TOF-SIMS – Time-of-Flight Secondary Ion Mass Spectrometry
Description: Time-of-flight secondary ion mass spectrometry (TOF-SIMS) is an analytical technique used to study the chemical composition and molecular structure of surfaces at the nanometer scale. In TOF-SIMS, a primary ion beam is directed onto a surface, and this beam sputters secondary ions from the surface. The secondary ions are then analyzed in a time-of-flight …