PIXE – Particle Induced X-ray Emission
Description: Particle-Induced X-ray Emission (PIXE) analysis is a technique used for elemental analysis and characterization of materials. It involves bombarding a sample with a beam of high-energy (MeV) charged particles (usually protons or alpha particles), which leads to the emission of characteristic X-rays from the atoms in the sample. These emitted X-rays are then detected …


