Materials Characterization Services
Search for Analytical Techniques and Test Methods
We are currently working on updating our list of supported methods. If you don’t see the test method you need below, please submit a special request with details about the method you need and we will check to see if we can provide it.
ASTM C202 – Standard Test Method for Thermal Conductivity of Refractory Brick Description: Significance and Use 3.1 The thermal conductivity of refractory brick is a property required for selecting their thermal transmission characteristics. Users select refractory brick to provide specified conditions of heat loss and cold face temperature, without exceeding the temperature limitation of the brick. …
Profilometry is a technique used to measure surface topography, profile, roughness, and other surface characteristics of objects or materials. It involves the measurement and analysis of surface features, such as height variations, texture, and roughness, to obtain detailed information about the surface morphology. Profilometry can be categorized into contact and non-contact methods, each with its …
Description: X-ray Fluorescence (XRF) is an analytical technique used for the qualitative and quantitative determination of the elemental composition of various materials. It works by measuring the characteristic X-rays emitted when a sample is irradiated with high-energy X-rays or gamma rays. These emitted X-rays are associated with the inner electron transitions of atoms in the …
Description: X-ray Diffraction (XRD) is a powerful analytical technique used to investigate the structure of crystalline materials by analyzing the way X-rays are scattered by the crystal lattice. XRD is based on the principle of Bragg’s law, which states that X-rays incident on a crystal at a specific angle will undergo constructive interference and produce …
Description: VPD-ICP-MS stands for Vapor Phase Decomposition-Inductively Coupled Plasma Mass Spectrometry. It is an analytical technique used in the field of analytical chemistry and is primarily employed for the analysis of solid samples, especially those containing metals or other elements of interest. VPD-ICP-MS combines two key components: Vapor Phase Decomposition (VPD) and Inductively Coupled Plasma …
Description: Total Reflection X-Ray Fluorescence (TXRF) is an analytical technique used for elemental analysis. It is a specialized form of X-ray fluorescence (XRF) spectroscopy that is particularly useful for analyzing trace elements on a solid surface. Here is a description of TXRF, its applications, strengths, and limitations: In summary, Total Reflection X-Ray Fluorescence is a …
Description: Secondary Ion Mass Spectrometry (SIMS) is an analytical technique used for the elemental and isotopic analysis of solid materials. It provides detailed information about the composition and distribution of elements and isotopes on the surface of a sample. SIMS works by bombarding the surface of a sample with a primary ion beam, which causes …
Description: Rutherford Backscattering Spectrometry (RBS) is an ion scattering technique that is used primarily for compositional thin film analysis. RBS is unique in that it allows quantification without the use of reference standards and is frequently used to calibrate other analytical methods. It is typically the method of choice for quantitative compositional analysis of thin …
Description: Positron Annihilation Lifetime Spectroscopy (PALS) is a non-destructive analytical technique used to study the behavior of positrons in matter. Positrons are the antimatter counterparts of electrons, and when they encounter electrons in a material, they can annihilate each other, releasing gamma-ray photons. PALS measures the time delay between the creation of positron-electron pairs and …
Description: Nanoindentation analysis is a versatile and powerful technique used to measure mechanical properties of materials at the nanoscale. It involves using a sharp indenter, often made of diamond or another hard material, to apply a controlled force or load to the surface of a material while continuously monitoring the depth of penetration. This process …
